ELECTRONIC-STRUCTURE OF SIO2, SIXGE1-XO2, AND GEO2 FROM PHOTOEMISSION SPECTROSCOPY

被引：105
|
作者：
FISCHER, B [1 ]
POLLAK, RA [1 ]
DISTEFANO, TH [1 ]
GROBMAN, WD [1 ]
机构：
[1] IBM CORP, THOMAS J WATSON RES CTR, YORKTOWN HTS, NY 10598 USA
来源：
PHYSICAL REVIEW B | 1977年 / 15卷 / 06期
关键词：
D O I：
10.1103/PhysRevB.15.3193
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：3193 / 3199
页数：7
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