ADVANCES IN SILICON TECHNOLOGY FOR THE SEMICONDUCTOR INDUSTRY .2.

被引：0
|
作者：
SWAROOP, RB
机构：
来源：
SOLID STATE TECHNOLOGY | 1983年 / 26卷 / 07期
关键词：
Compendex;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
SEMICONDUCTOR DEVICE MANUFACTURE
引用
收藏
页码：97 / 101
页数：5
相关论文
共 50 条
  • [21] ADVANCES IN AUGER MICROANALYSIS FOR SEMICONDUCTOR TECHNOLOGY
    PAMLER, W
    SURFACE AND INTERFACE ANALYSIS, 1994, 22 (1-12) : 331 - 337
  • [22] SPECTROSCOPIC CHARACTERIZATION TECHNIQUES FOR SEMICONDUCTOR TECHNOLOGY .2. INTRODUCTION
    POLLAK, FH
    TSU, R
    PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS, 1985, 524 : R5 - R5
  • [23] Recent Advances in Fault Isolation for Semiconductor Industry
    Chin, Jiann Min
    Narang, Vinod
    Tay, Meng Yeow
    Phoa, Shei Lay
    Venkat, Ravikumar
    Ei, Lwin Hnin
    Lim, Soon Huat
    Teo, Chea Wei
    Zulkifli, Syahirah
    Qiu, Wen
    Tan, Joseph
    Ranganathan, Gopi
    Oh, Zi Ying
    Foo, Fang Jie
    PROCEEDINGS OF THE 2013 20TH IEEE INTERNATIONAL SYMPOSIUM ON THE PHYSICAL & FAILURE ANALYSIS OF INTEGRATED CIRCUITS (IPFA 2013), 2013, : 269 - 279
  • [24] Thin Film Diamond Advances the Semiconductor Industry
    Hickey, Diane P.
    Kane, Neil
    Carlisle, John
    ADVANCED MATERIALS & PROCESSES, 2010, 168 (05): : 56 - 57
  • [25] ADVANCES IN CRIMINAL TECHNOLOGY .2. INFRARED RADIATION AND THERMOGRAPHY
    ITEN, PX
    KRIMINALISTIK, 1981, (05): : 182 - 188
  • [26] Thin film diamond advances the semiconductor industry
    Hickey, Diane P.
    Kane, Neil
    Carlisle, John
    Advanced Materials and Processes, 2010, 168 (05): : 56 - 57
  • [27] CHEMICAL-IMPURITIES AND STRUCTURAL IMPERFECTIONS IN SEMICONDUCTOR SILICON .2.
    HUFF, HR
    SOLID STATE TECHNOLOGY, 1983, 26 (04) : 211 - 222
  • [28] Review of the semiconductor industry and technology roadmap
    Kumar S.
    Krenner N.
    Journal of Science Education and Technology, 2002, 11 (3) : 229 - 236
  • [29] Perspective of nano technology in semiconductor industry
    Suh, Kwang-Pyuk
    IEEE NMDC 2006: IEEE NANOTECHNOLOGY MATERIALS AND DEVICES CONFERENCE 2006, PROCEEDINGS, 2006, : 66 - 66
  • [30] TECHNOLOGY OF INTEGRATED SEMICONDUCTOR CIRCUITS OF SILICON
    MURRMANN, H
    MESSTECHNIK, 1969, 77 (06): : 143 - +
12345