AN ADVANCED CRT-SPOT-CONTOUR MEASUREMENT SYSTEM

被引：0
|
作者：
BAUR, B
机构：
来源：
PROCEEDINGS OF THE SID | 1985年 / 26卷 / 01期
关键词：
D O I：
暂无
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：55 / 57
页数：3
相关论文
共 50 条
  • [31] Development and Application of Advanced Reactivity Measurement System
    Wang L.
    Yang Q.
    Du B.
    Yang B.
    Qin Y.
    Shi J.
    Hedongli Gongcheng/Nuclear Power Engineering, 2019, 40 (06): : 46 - 49
  • [32] ADVANCED RAPID ATTENUATION MEASUREMENT SYSTEM (ARAMS)
    YU, YB
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1982, 29 (06) : 1930 - 1934
  • [33] Advanced Measurement for Sports Surface System Behaviour
    Wang, Xinyi
    Fleming, Paul
    Dixon, Neil
    ENGINEERING OF SPORT CONFERENCE 2012, 2012, 34 : 825 - 830
  • [34] Advanced laser measurement system for civil infrastructures
    Miyashita, T.
    Ishii, H.
    Kubota, K.
    Fujino, Y.
    STRUCTURAL HEALTH MONITORING 2007: QUANTIFICATION, VALIDATION, AND IMPLEMENTATION, VOLS 1 AND 2, 2007, : 1511 - 1519
  • [35] Advanced optical system for scanning-spot photorefractive keratectomy (PRK)
    Mrochen, M
    Wüllner, C
    Semchishen, V
    Seiler, T
    OPHTHALMIC TECHNOLOGIES IX, PROCEEDINGS OF, 1999, 3591 : 146 - 153
  • [36] Surface area measurement based on a photoelectric image collimation system and an active contour
    Zhao, Peng
    Pu, Zhao Bang
    OPTICAL ENGINEERING, 2007, 46 (10)
  • [37] Embedded System Design of an Advanced Illumination Measurement System for Highways
    Johnson, Mathew
    Fabregas, Aldo
    Wang, Zhenyu
    Katkoori, Srinivas
    Lin, Pei-Sung
    2014 8TH ANNUAL IEEE SYSTEMS CONFERENCE (SYSCON), 2014, : 579 - 586
  • [38] CONTOUR CRAFTING OF ADVANCED CERAMIC MATERIALS
    Shirooyeh, Mahmood
    Vali, Mohammadaref
    Shackleford, David
    Torabi, Payman
    Rehrig, Paul W.
    Kwon, Oh-Hun
    Khoshnevis, Behrokh
    ADVANCED PROCESSING AND MANUFACTURING TECHNOLOGIES FOR NANOSTRUCTURED AND MULTIFUNCTIONAL MATERIALS II, 2016, : 159 - 168
  • [39] The design and realization of continuous temperature measurement system with multi-spot
    Huang, Wei-li
    Wen, Yu-lian
    Chen, Yan-bo
    Wang, Jian-jun
    General System and Control System, Vol I, 2007, : 157 - 160
  • [40] Application of Spot Quality Evaluation in Subgrade Settlement Monitoring and Measurement System
    Min Yongzhi
    Sun Tianfang
    LASER & OPTOELECTRONICS PROGRESS, 2023, 60 (04)
12345