FACTORS AFFECTING PRECISION AND ACCURACY IN QUANTITATIVE-ANALYSIS BY SECONDARY ION MASS-SPECTROMETRY

被引：24

作者：

DENG, RC ^{[1
]}

WILLIAMS, P ^{[1
]}

机构：

[1] ARIZONA STATE UNIV,DEPT CHEM,TEMPE,AZ 85287

来源：

ANALYTICAL CHEMISTRY | 1989年 / 61卷 / 17期

关键词：

D O I：

10.1021/ac00192a035

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：1946 / 1948

页数：3

共 50 条

[41] SECONDARY ION MASS-SPECTROMETRY
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ANNUAL REVIEW OF MATERIALS SCIENCE, 1985, 15 : 517 - 548
[42] SECONDARY ION MASS-SPECTROMETRY
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VACUUM, 1984, 34 (3-4) : 479 - 480
[43] SECONDARY-ION MASS-SPECTROMETRY AS A QUANTITATIVE MICROANALYTICAL TECHNIQUE
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MICHIELS, F
MOENS, M
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ANALYTICA CHIMICA ACTA, 1989, 216 (1-2) : 25 - 55
[44] QUANTITATIVE-ANALYSIS OF ORGANO-MERCURY COMPOUNDS BY MASS-SPECTROMETRY
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[45] QUANTITATIVE-ANALYSIS OF TERBUTALINE BY GAS-CHROMATOGRAPHY - MASS-SPECTROMETRY
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[49] QUANTITATIVE-ANALYSIS OF HE IN SOLIDS BY SPUTTERED NEUTRAL MASS-SPECTROMETRY
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[50] LIMITS OF QUANTITATIVE MICROANALYSIS USING SECONDARY ION MASS-SPECTROMETRY
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