FACTORS AFFECTING PRECISION AND ACCURACY IN QUANTITATIVE-ANALYSIS BY SECONDARY ION MASS-SPECTROMETRY

被引：24

作者：

DENG, RC ^{[1
]}

WILLIAMS, P ^{[1
]}

机构：

[1] ARIZONA STATE UNIV,DEPT CHEM,TEMPE,AZ 85287

来源：

ANALYTICAL CHEMISTRY | 1989年 / 61卷 / 17期

关键词：

D O I：

10.1021/ac00192a035

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：1946 / 1948

页数：3

共 50 条

[1] METHODS FOR QUANTITATIVE-ANALYSIS IN SECONDARY ION MASS-SPECTROMETRY
NEWBURY, DE
SCANNING, 1980, 3 (02) : 110 - 118
[2] QUANTITATIVE-ANALYSIS OF ELECTRODEPOSIT ON STEEL BY SECONDARY ION MASS-SPECTROMETRY
SUZUKI, T
OHASHI, Y
TSUNOYAMA, K
TETSU TO HAGANE-JOURNAL OF THE IRON AND STEEL INSTITUTE OF JAPAN, 1986, 72 (11): : 1775 - 1781
[3] QUANTITATIVE-ANALYSIS OF GLASSES AND SILICATES USING SECONDARY ION MASS-SPECTROMETRY
MORGAN, AE
WERNER, HW
JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1977, 2 (01): : 88 - 88
[4] QUANTITATIVE-ANALYSIS BY SUB-MICRON SECONDARY ION MASS-SPECTROMETRY
SATOH, H
OWARI, M
NIHEI, Y
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1988, 6 (03): : 915 - 918
[5] QUANTITATIVE-ANALYSIS IN CHEMICALLY DISSIMILAR MATRICES BY SECONDARY ION MASS-SPECTROMETRY
KATZ, W
SMITH, GA
WEI, CY
APPLIED SURFACE SCIENCE, 1983, 15 (1-4) : 247 - 254
[6] QUANTITATIVE-ANALYSIS OF IMPURITIES IN HGCDTE USING SECONDARY ION MASS-SPECTROMETRY
LAPIDES, LE
SURFACE AND INTERFACE ANALYSIS, 1985, 7 (05) : 211 - 216
[7] PRECISION OF QUANTITATIVE-ANALYSIS METHODS IN SPARK MASS-SPECTROMETRY
ORDZHONIKIDZE, KG
SAMADASH.OA
GLINSKIK.VM
YUREVA, OK
KARPENKO, IK
ZHURNAL ANALITICHESKOI KHIMII, 1972, 27 (12): : 2310 - 2313
[8] QUANTITATIVE-ANALYSIS BY THIN-LAYER CHROMATOGRAPHY WITH SECONDARY ION MASS-SPECTROMETRY
BANNO, K
MATSUOKA, M
TAKAHASHI, R
CHROMATOGRAPHIA, 1991, 32 (3-4) : 179 - 181
[9] QUANTITATIVE-ANALYSIS OF LOW-ALLOY STEELS BY SECONDARY ION MASS-SPECTROMETRY
MORGAN, AE
WERNER, HW
ANALYTICAL CHEMISTRY, 1976, 48 (04) : 699 - 708
[10] QUANTITATIVE-ANALYSIS OF IMPURITIES IN SIMOX SAMPLES USING SECONDARY ION MASS-SPECTROMETRY
CHI, PH
SIMONS, DS
ROITMAN, P
SURFACE AND INTERFACE ANALYSIS, 1991, 17 (01) : 57 - 61

← 1 2 3 4 5 →