EFFECTS OF INTERFACE STRUCTURE ON THE ELECTRICAL CHARACTERISTICS OF PTSI-SI SCHOTTKY-BARRIER CONTACTS

被引：7
|
作者：
TSAUR, BY
SILVERSMITH, DJ
MOUNTAIN, RW
ANDERSON, CH
机构：
来源：
THIN SOLID FILMS | 1982年 / 93卷 / 3-4期
关键词：
D O I：
10.1016/0040-6090(82)90139-0
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：331 / 340
页数：10
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