GROWTH OF SILVER ON MOLYBDENITE INSIDE ELECTRON MICROSCOPE

被引:0
|
作者
POPPA, HR
机构
关键词
D O I
暂无
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:2518 / &
相关论文
共 50 条
  • [31] EXPERIMENTAL INVESTIGATION OF NUCLEATION OF SILVER ON MOLYBDENITE
    CORBETT, JM
    BOSWELL, FW
    JOURNAL OF APPLIED PHYSICS, 1969, 40 (06) : 2663 - &
  • [32] System Calibration Towards Automated Nanomanipulation Inside Scanning Electron Microscope
    Wang, Mingyu
    Wang, Yaqiong
    Yang, Zhan
    Chen, Tao
    Sun, Lining
    Fukuda, Toshio
    2017 IEEE 7TH ANNUAL INTERNATIONAL CONFERENCE ON CYBER TECHNOLOGY IN AUTOMATION, CONTROL, AND INTELLIGENT SYSTEMS (CYBER), 2017, : 1135 - 1140
  • [33] Operando two-terminal devices inside a transmission electron microscope
    Oscar Recalde-Benitez
    Tianshu Jiang
    Robert Winkler
    Yating Ruan
    Alexander Zintler
    Esmaeil Adabifiroozjaei
    Alexey Arzumanov
    William A. Hubbard
    Tijn van Omme
    Yevheniy Pivak
    Hector H. Perez-Garza
    B. C. Regan
    Lambert Alff
    Philipp Komissinskiy
    Leopoldo Molina-Luna
    Communications Engineering, 2 (1):
  • [34] APPARATUS FOR MEASUREMENT OF FRICTION ON THIN FOILS INSIDE AN ELECTRON-MICROSCOPE
    HEURTEL, A
    COURTEL, R
    MAUGIS, D
    JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1976, 9 (09): : 752 - 755
  • [35] Instrumental developments for in situ breakdown experiments inside a scanning electron microscope
    Muranaka, T.
    Blom, T.
    Leifer, K.
    Ziemann, V.
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2011, 657 (01): : 122 - 125
  • [36] DEVICE FOR STRAINING AND FRACTURING THIN FOIL SPECIMENS INSIDE AN ELECTRON MICROSCOPE
    FORSYTH, PJE
    WILSON, RN
    JOURNAL OF SCIENTIFIC INSTRUMENTS, 1960, 37 (01): : 37 - 38
  • [37] Nanoactuation of telescoping multiwalled carbon nanotubes inside transmission electron microscope
    Nakajima, Masahiro
    Arai, Shigeo
    Saito, Yahachi
    Arai, Fumihito
    Fukuda, Toshio
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 2007, 46 (41-44): : L1035 - L1038
  • [38] FRACTURE TESTING OF NANOSCALE THIN FILMS INSIDE THE TRANSMISSION ELECTRON MICROSCOPE
    Kumar, Sandeep
    Haque, M. A.
    INTERNATIONAL JOURNAL OF APPLIED MECHANICS, 2010, 2 (04) : 745 - 758
  • [39] Optical and Optoelectronic Property Analysis of Nanomaterials inside Transmission Electron Microscope
    Fernando, Joseph F. S.
    Zhang, Chao
    Firestein, Konstantin L.
    Golberg, Dmitri
    SMALL, 2017, 13 (45)
  • [40] ION DAMAGE TO SILICON-CRYSTALS INSIDE AN ELECTRON-MICROSCOPE
    URBAN, K
    PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1981, 66 (01): : 213 - 218