THE PHOTOELECTRON X-RAY MICROSCOPE, A POSSIBLE TOOL FOR ANALYTICAL SOFT-X-RAY MICROSCOPY

被引：0
|
作者：
POLACK, F
LOWENTHAL, S
机构：
[1] UNIV PARIS 11,INST OPT,BATIMENT 503,BP 43,F-91406 ORSAY,FRANCE
[2] UNIV PARIS 11,LAB UTITISAT RAYONNEMENT ELECTROMAGNET,F-91405 ORSAY,FRANCE
来源：
SCANNING MICROSCOPY | 1987年
关键词：
D O I：
暂无
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
引用
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页码：41 / 46
页数：6
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