CRYOGENIC RANDOM-ACCESS MEMORIES

被引：1
|
作者：
SASS, AR
STEWART, WC
COSENTINO, LS
机构：
来源：
IEEE SPECTRUM | 1967年 / 4卷 / 07期
关键词：
D O I：
10.1109/MSPEC.1967.5215859
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：91 / +
页数：1
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