REFLECTIVITY AND TRANSMITTIVITY OF A STACK OF THIN-FILMS IN THE SOFT-X-RAY REGION

被引：4
|
作者：
LITZMAN, O [1 ]
ROZSA, P [1 ]
机构：
[1] TECH UNIV BUDAPEST,FAC ELECT ENGN,DEPT MATH,H-1521 BUDAPEST,HUNGARY
来源：
OPTICA ACTA | 1984年 / 31卷 / 12期
关键词：
D O I：
10.1080/713821462
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
引用
收藏
页码：1351 / 1359
页数：9
相关论文
共 50 条
  • [21] REFLECTIVITY OF GOLD COATED SURFACES IN SOFT-X-RAY RANGE
    COSTA, E
    AURIEMMA, G
    BOCCACCINI, L
    UBERTINI, P
    APPLIED OPTICS, 1978, 17 (04): : 621 - 623
  • [22] THE INFLUENCE OF THIN-FILM GROWTH-PROCESSES ON THE SOFT-X-RAY REFLECTIVITY OF MULTILAYERS
    EVANS, BL
    SHI, X
    JOURNAL OF MODERN OPTICS, 1992, 39 (08) : 1695 - 1707
  • [23] OPTIMIZATION OF REFLECTIVITY OF PERIODIC AND QUASI-PERIODIC MULTILAYER FILMS AT SOFT-X-RAY WAVELENGTHS
    GU, E
    MARR, GV
    PLAYER, MA
    OPTICS COMMUNICATIONS, 1990, 77 (01) : 99 - 106
  • [24] COHERENT BACKSCATTERING IN THE SOFT-X-RAY REGION
    LUCCIO, A
    MATONE, G
    MICELI, L
    GIORDANO, G
    LASER AND PARTICLE BEAMS, 1990, 8 (03) : 383 - 398
  • [25] CHARACTERIZATION OF PHOSPHORS IN THE SOFT-X-RAY REGION
    YANG, BX
    KIRZ, J
    XU, S
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1987, 258 (01): : 141 - 145
  • [26] FEASIBILITY OF HOLOGRAPHY IN THE SOFT-X-RAY REGION
    GUR, J
    JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1979, 69 (10) : 1415 - 1415
  • [27] SOFT-X-RAY IMAGE OF ALGOL REGION
    HARNDEN, FR
    FABRICANT, D
    TOPKA, K
    FLANNERY, BP
    TUCKER, WH
    GORENSTEIN, P
    ASTROPHYSICAL JOURNAL, 1977, 214 (02): : 418 - 422
  • [28] Characterization of thin films by means of soft X-ray reflectivity measurements
    Friedrich, J
    APPLICATION OF ACCELERATORS IN RESEARCH AND INDUSTRY, PTS 1 AND 2, 1999, 475 : 492 - 495
  • [29] MULTILAYER GRATINGS FOR THE SOFT-X-RAY REGION
    ANDRE, JM
    SAMMAR, A
    MALEK, CK
    TROUSSEL, P
    BAC, S
    BARCHEWITZ, R
    PARDO, B
    BERROUANE, H
    MORENO, T
    LADAN, FR
    RIVOIRA, R
    SCHIRMANN, D
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1992, 63 (01): : 1399 - 1403
  • [30] SIMULTANEOUS DETERMINATION OF THE OPTICAL-CONSTANTS AND THICKNESS OF VERY THIN-FILMS BY USING SOFT-X-RAY REFLECTANCE MEASUREMENTS
    CAO, JL
    YANAGIHARA, M
    YAMAMOTO, M
    GOTO, Y
    NAMIOKA, T
    APPLIED OPTICS, 1994, 33 (10): : 2013 - 2017
12345