THEORY FOR OPTIMUM CENSORED ACCELERATED LIFE TESTS FOR NORMAL AND LOGNORMAL LIFE DISTRIBUTIONS

被引：115

作者：

NELSON, W

KIELPINSKI, TJ

机构：

[1] GE, SCHENECTADY, NY 12345 USA

[2] USAF, 6514 TEST SQUADRON, HILL AFB, UT 84406 USA

来源：

TECHNOMETRICS | 1976年 / 18卷 / 01期

关键词：

D O I：

10.2307/1267923

中图分类号：

O21 [概率论与数理统计]; C8 [统计学];

学科分类号：

020208 ; 070103 ; 0714 ;

摘要：

引用

页码：105 / 114

页数：10

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