THE APPLICATION OF NPL X-RAY GRATINGS TO LOW ATOMIC NUMBER ELEMENT ELECTRON PROBE MICROANALYSIS

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作者：
FRANKS, A
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JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 1964年 / 111卷 / 08期
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O646 [电化学、电解、磁化学];
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081704 ;
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页码：C201 / C201
页数：1
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