THE APPLICATION OF NPL X-RAY GRATINGS TO LOW ATOMIC NUMBER ELEMENT ELECTRON PROBE MICROANALYSIS

被引：0

|

作者：

FRANKS, A

机构：

来源：

JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 1964年 / 111卷 / 08期

关键词：

D O I：

暂无

中图分类号：

O646 [电化学、电解、磁化学];

学科分类号：

081704 ;

摘要：

引用

收藏

页码：C201 / C201

页数：1

相关论文

共 50 条

[1] ABSORPTION AND ATOMIC NUMBER CORRECTIONS IN ELECTRON-PROBE X-RAY MICROANALYSIS
BISHOP, HE
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1968, 1 (06) : 673 - &
[2] Correction for Atomic Number in X-ray Electron Probe Microanalysis by Spectra of Reflected Electrons
Il'in, N. P.
JOURNAL OF ANALYTICAL CHEMISTRY, 2015, 70 (09) : 1092 - 1102
[3] Correction for atomic number in X-ray electron probe microanalysis by spectra of reflected electrons
N. P. Il’in
Journal of Analytical Chemistry, 2015, 70 : 1092 - 1102
[4] ELECTRON PROBE METHODS OF X-RAY MICROANALYSIS
DUNCUMB, P
BRITISH JOURNAL OF APPLIED PHYSICS, 1960, 11 (05): : 169 - 176
[5] Electron probe X-ray microanalysis of coatings
Valamontes, E
Nassiopoulos, AG
MIKROCHIMICA ACTA, 1996, : 605 - 610
[6] NPL GRATINGS FOR X-RAY SPECTROSCOPY
SAYCE, LA
FRANKS, A
PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1964, 282 (1390) : 353 - +
[7] METHODS OF INTRODUCING ATOMIC-NUMBER CORRECTION DURING X-RAY SPECTRAL MICROANALYSIS WITH THE ELECTRON-PROBE
LAVRENTEV, YG
INDUSTRIAL LABORATORY, 1981, 47 (06): : 570 - 578
[8] ELECTRON-PROBE MICROANALYSIS OF LOW ATOMIC NUMBER ELEMENTS
RANZETTA, GV
SCOTT, VD
BRITISH JOURNAL OF APPLIED PHYSICS, 1964, 15 (03): : 263 - &
[9] Development of X-ray electron probe microanalysis in Siberia
L. A. Pavlova
Journal of Analytical Chemistry, 2008, 63 : 1199 - 1205
[10] ELECTRON PROBE X-RAY MICROANALYSIS OF A NORMAL CENTRIOL
SCHAFER, PW
CHANDLER, JA
SCIENCE, 1970, 170 (3963) : 1204 - &

← 1 2 3 4 5 →