REGIMES OF SURFACE-ROUGHNESS MEASURABLE WITH LIGHT-SCATTERING

被引:92
|
作者
VORBURGER, TV
MARX, E
LETTIERI, TR
机构
[1] Precision Engineering Division, National Institute of Standards and Technology, Gaithersburg, MD
来源
APPLIED OPTICS | 1993年 / 32卷 / 19期
关键词
ANGLE-RESOLVED SCATTERING; AUTOCORRELATION; AUTOCOVARIANCE; BIDIRECTIONAL REFLECTANCE DISTRIBUTION FUNCTION; LIGHT SCATTERING; POWER SPECTRAL DENSITY; RMS ROUGHNESS; RMS SLOPE; SPECULAR BEAM; SURFACE ROUGHNESS;
D O I
10.1364/AO.32.003401
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
In this paper we summarize a number of previous experiments on the measurement of the roughness of metallic surfaces by light scattering. We identify several regimes that permit measurement of different surface parameters and functions, and we establish approximate limits for each regime. Using a straightforward criterion, we calculate that the smooth-surface regime, in which the angular distribution of scattered light is closely related to the power spectral density of the roughness, ranges over 0 < sigma/lambda less than or similar to 0.05, where sigma is the rms roughness and lambda is the opitcal wavelength. Above that the surface autocorrelation function may be calculated from a Fourier transform of the angular distribution over 0 < sigma/lambda less than or similar to 0.14. Then comes the specular regime where the specular beam can still be identified and measured over 0 < sigma/lambda less than or similar to 0.3. For all these regimes and for rougher surfaces too, the rms width of the scatter distribution is proportional to the rms slope of the surface.
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页码:3401 / 3408
页数:8
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