A COMPARISON OF ACCELERATED LIFE TEST PLANS FOR WEIBULL AND LOGNORMAL DISTRIBUTIONS AND TYPE-1 CENSORING

被引：110

|

作者：

MEEKER, WQ

机构：

来源：

TECHNOMETRICS | 1984年 / 26卷 / 02期

关键词：

D O I：

10.2307/1268110

中图分类号：

O21 [概率论与数理统计]; C8 [统计学];

学科分类号：

020208 ; 070103 ; 0714 ;

摘要：

引用

收藏

页码：157 / 171

页数：15

相关论文

共 50 条

[21] ROBUSTNESS OF EXPONENTIAL TEST PLANS TO WEIBULL-DISTRIBUTIONS
SHARMA, KK
RANA, RS
RELIABILITY ENGINEERING & SYSTEM SAFETY, 1992, 35 (02) : 169 - 171
[22] FAILURE-CENSORED VARIABLES-SAMPLING PLANS FOR LOGNORMAL AND WEIBULL-DISTRIBUTIONS
SCHNEIDER, H
TECHNOMETRICS, 1989, 31 (02) : 199 - 206
[23] Reliability model for dual constant-stress accelerated life test with Weibull distribution under Type-I censoring scheme
Feng, Xuefeng
Tang, Jiayin
Tan, Qitao
Yin, Zekai
COMMUNICATIONS IN STATISTICS-THEORY AND METHODS, 2022, 51 (24) : 8579 - 8597
[24] OPTIMUM CENSORED ACCELERATED LIFE TESTS FOR NORMAL AND LOGNORMAL LIFE DISTRIBUTIONS
KIELPINSKI, TJ
NELSON, W
IEEE TRANSACTIONS ON RELIABILITY, 1975, 24 (05) : 310 - 320
[25] Generalized Fiducial Inference for Accelerated Life Tests With Weibull Distribution and Progressively Type-II Censoring
Chen, Piao
Xu, Ancha
Ye, Zhi-Sheng
IEEE TRANSACTIONS ON RELIABILITY, 2016, 65 (04) : 1737 - 1744
[26] THEORY FOR OPTIMUM CENSORED ACCELERATED LIFE TESTS FOR NORMAL AND LOGNORMAL LIFE DISTRIBUTIONS
NELSON, W
KIELPINSKI, TJ
TECHNOMETRICS, 1976, 18 (01) : 105 - 114
[27] Optimal design of cyclic-stress accelerated life tests for lognormal lifetime distribution under type I censoring
Kim, Seung-Hyun
Sung, Si-Il
MICROELECTRONICS RELIABILITY, 2021, 126
[28] ECM algorithm of Parametric Estimation in constant stress accelerated life for mixture Weibull distribution with type II censoring
Jiang, Hui
PROCEEDINGS OF THE 2015 INTERNATIONAL CONFERENCE ON COMPUTER SCIENCE AND INTELLIGENT COMMUNICATION, 2015, 16 : 279 - 282
[29] OPTIMAL-DESIGN OF PARTIALLY ACCELERATED LIFE TESTS FOR THE LOGNORMAL-DISTRIBUTION UNDER TYPE-I CENSORING
BAI, DS
CHUNG, SW
CHUN, YR
RELIABILITY ENGINEERING & SYSTEM SAFETY, 1993, 40 (01) : 85 - 92
[30] OPTIMUM SIMPLE STEP-STRESS ACCELERATED LIFE TESTS FOR WEIBULL DISTRIBUTION AND TYPE-I CENSORING
BAI, DS
KIM, MS
NAVAL RESEARCH LOGISTICS, 1993, 40 (02) : 193 - 210

← 1 2 3 4 5 →