Comparative EMC-investigations on electronic system level and IC-level

被引：0

作者：

Lamedschwandner, K. ^{[1
]}

Deutschmann, B. ^{[2
]}

Winkler, G. ^{[3
]}

Ostermann, T. ^{[4
]}

机构：

[1] Seibersdorf Res GmbH, Geschaftsfeld Sichere Mobilkommunikat, A-2444 Seibersdorf, Austria

[2] Austriamicrosystems AG, EMC R&D, A-8141 Unterpremstatten, Austria

[3] Graz Univ Technol, Inst Elekt, Inffeldgasse 12, A-8010 Graz, Austria

[4] Johannes Kepler Univ Linz, Inst Integrierte Schaltungen, A-4040 Linz, Austria

来源：

ELEKTROTECHNIK UND INFORMATIONSTECHNIK | 2006年 / 123卷 / 1-2期

关键词：

electromagnetic compatibility (EMC); emission; susceptibility; electronic devices; integrated circuits; conformity assessment;

D O I：

10.1007/s00502-006-0306

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In modern electronic system design integrated circuits (ICs) can be the source for potential EMC problems. They are often the reason, why an electronic device does not meet the regulatory requirements. Therefore electronic device designers demand for ICs with "good'' EMC performance. However, EMC assessment on system level and on IC level uses different methods. It is not easy to say, in which way a forecast of the EMC behavior for an application is possible on the basis of EMC measurement results at IC level. This article is a contribution in order to fill this gap.

引用

页码：9 / 14

页数：6

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