MEASUREMENT OF THE COMPLEX PERMITTIVITY OF LOW-LOSS PLANAR MICROWAVE SUBSTRATES USING APERTURE-COUPLED MICROSTRIP RESONATORS

被引：3
|
作者：
SAED, MA
机构：
[1] Department of Electrical Engineering, State University of New York, College at New Paltz, New Paltz
来源：
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 1993年 / 41卷 / 08期
关键词：
D O I：
10.1109/22.241673
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
This paper describes a technique for the determination of the complex permittivity of low-loss dielectric substrates at microwave frequencies. The technique utilizes an aperture-coupled microstrip resonator fed using a microstrip line in a two layer configuration. The ends of the resonator are shorted in order to avoid radiation. The technique can also be used for the measurement of the complex permittivity of other electronic materials such as thin and thick film materials at microwave frequencies. Nonresonant modes and conductor losses are taken into account in the analysis to improve the accuracy of the results. Analysis procedure as well as experimental results are presented.
引用
收藏
页码：1343 / 1348
页数：6
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