MEASUREMENT OF STRESS IN DIAMOND ANVILS WITH MICRO-RAMAN SPECTROSCOPY

被引：102
|
作者：
SHARMA, SK [1 ]
MAO, HK [1 ]
BELL, PM [1 ]
XU, JA [1 ]
机构：
[1] GEOPHYS LAB,WASHINGTON,DC 20008
来源：
JOURNAL OF RAMAN SPECTROSCOPY | 1985年 / 16卷 / 05期
关键词：
D O I：
10.1002/jrs.1250160513
中图分类号：
O433 [光谱学];
学科分类号：
0703 ; 070302 ;
摘要：
引用
收藏
页码：350 / 352
页数：3
相关论文
共 50 条
  • [21] Micro-Raman Stress Investigation of Polycrystalline Diamond Compact (PDC)
    Xu Guo-Ping
    Xu Gen
    Yin Zhi-Min
    Jiang Rong-Chao
    ADVANCES IN ABRASIVE TECHNOLOGY XII, 2009, 76-78 : 690 - +
  • [22] Stress measurements using ultraviolet micro-Raman spectroscopy
    Dombrowski, KF
    De Wolf, I
    Dietrich, B
    APPLIED PHYSICS LETTERS, 1999, 75 (16) : 2450 - 2451
  • [23] Stress characterization of MEMS microbridges by micro-Raman spectroscopy
    Starman, LA
    Lott, JA
    Amer, MS
    Cowan, WD
    Busbee, JD
    SENSORS AND ACTUATORS A-PHYSICAL, 2003, 104 (02) : 107 - 116
  • [24] The comparative study on diamond film by near-field Raman spectroscopy and micro-Raman spectroscopy
    Wang, JJ
    Yan, H
    Dong, YJ
    Li, HD
    Zhang, YF
    Zhang, F
    Xia, ZJ
    Gao, QJ
    Du, WM
    Zhou, HT
    Zou, YH
    SOLID STATE COMMUNICATIONS, 2000, 115 (04) : 173 - 177
  • [25] Mechanical stress measurements using micro-Raman spectroscopy
    De Wolf, I
    Maes, HE
    MICROSYSTEM TECHNOLOGIES, 1998, 5 (01) : 13 - 17
  • [26] Mechanical stress measurements using micro-Raman spectroscopy
    I. De Wolf
    H. E. Maes
    Microsystem Technologies, 1998, 5 : 13 - 17
  • [27] Simultaneous measurement of temperature, stress, and electric field in GaN HEMTs with micro-Raman spectroscopy
    Bagnall, Kevin R.
    Moore, Elizabeth A.
    Badescu, Stefan C.
    Zhang, Lenan
    Wang, Evelyn N.
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2017, 88 (11):
  • [28] Two-dimensional stress measurement of a micromachined piezoresistive structure with micro-Raman spectroscopy
    Qian, J
    Yu, TX
    Zhao, YP
    MICROSYSTEM TECHNOLOGIES-MICRO-AND NANOSYSTEMS-INFORMATION STORAGE AND PROCESSING SYSTEMS, 2005, 11 (2-3): : 97 - 103
  • [29] Measurement of residual stress in a multi-layer semiconductor heterostructure by micro-Raman spectroscopy
    Wei Qiu
    Cui-Li Cheng
    Ren-Rong Liang
    Chun-Wang Zhao
    Zhen-Kun Lei
    Yu-Cheng Zhao
    Lu-Lu Ma
    Jun Xu
    Hua-Jun Fang
    Yi-Lan Kang
    Acta Mechanica Sinica, 2016, 32 : 805 - 812
  • [30] Measurement of residual stress in a multi-layer semiconductor heterostructure by micro-Raman spectroscopy
    Wei Qiu
    Cui-Li Cheng
    Ren-Rong Liang
    Chun-Wang Zhao
    Zhen-Kun Lei
    Yu-Cheng Zhao
    Lu-Lu Ma
    Jun Xu
    Hua-Jun Fang
    Yi-Lan Kang
    Acta Mechanica Sinica, 2016, 32 (05) : 805 - 812
12345