INVESTIGATION OF SOME PHYSICAL-PROPERTIES OF THIN-FILMS BY X-RAY REFLECTIVITY

被引：7
|
作者：
BENATTAR, JJ
SCHALCHLI, A
机构：
[1] Service de Physique de l’Etat Condensè, F-91191, CEA-Saclay, Gif-sur-Yvette Cedex
来源：
PHYSICA SCRIPTA | 1994年 / 50卷 / 02期
关键词：
D O I：
10.1088/0031-8949/50/2/016
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
X-ray reflectivity at glancing angles is a very sensitive method which can be applied to the study of very different kinds of physical problems involving ultra thin films. In this paper we show: first, how we have solved a problem which dates back over three centuries: the structure of the Newton black film, second, how to investigate thermally induced capillary waves on a Langmuir monolayer of amphiphilic molecules and, finally, how to determine, with a very high accuracy, the density of a thin film of silica.
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页码：188 / 194
页数：7
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