BRIDGE SYSTEM FOR MEASURING HIGH RESISTANCES AND LOW CURRENTS

被引：0
|
作者：
KARLASHCHUK, VI
机构：
来源：
MEASUREMENT TECHNIQUES | 1973年 / 16卷 / 05期
关键词：
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：724 / 727
页数：4
相关论文
共 50 条
  • [41] The piezometer, an instrument for measuring resistances.
    Kelly, HA
    BULLETIN OF THE JOHNS HOPKINS HOSPITAL, 1904, 15 : 293 - 293
  • [42] A Low Cost Partial Discharge Measuring System for a High Voltage Laboratory
    Gunawardana, S. D. M. S.
    Kanchana, A. A. T.
    Perera, H. A. P. B.
    Wijesinghe, P. M.
    Lucas, J. R.
    Samarasinghe, R.
    2016 IEEE INTERNATIONAL CONFERENCE ON POWER SYSTEM TECHNOLOGY (POWERCON), 2016,
  • [43] MEASURING RESISTANCES OF ELECTRIFIED DIELECTRICS.
    Kandybko, A.M.
    1600, (29):
  • [44] PULSE METHOD FOR MEASURING CAPACITANCES AND RESISTANCES
    MYAZDRIKOV, OA
    MEASUREMENT TECHNIQUES-USSR, 1969, (07): : 983 - +
  • [45] A study of Cross-Bridge Kelvin Resistor structures for reliable measurement of low contact resistances
    Stavitski, N.
    Klootwijk, J. H.
    van Zeijl, H. W.
    Kovalgin, A. Y.
    Wolters, R. A. M.
    2008 IEEE INTERNATIONAL CONFERENCE ON MICROELECTRONIC TEST STRUCTURES, CONFERENCE PROCEEDINGS, 2008, : 199 - +
  • [46] Study of effects of changes of earthing resistances on geomagnetically induced currents in an electric power transmission system
    Pirjola, Risto
    RADIO SCIENCE, 2008, 43 (01)
  • [47] Measuring high and low flows
    Johnson, T
    Lemke, J
    CHEMICAL ENGINEERING PROGRESS, 2003, 99 (04) : 22 - 22
  • [48] Ultrastable low-noise current amplifier: A novel device for measuring small electric currents with high accuracy
    Drung, D.
    Krause, C.
    Becker, U.
    Scherer, H.
    Ahlers, F. J.
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2015, 86 (02):
  • [49] MEASURING AND CALIBRATION SYSTEM FOR CURRENTS DOWN TO 10-17 A
    BOHM, J
    ATOMKERNENERGIE, 1976, 27 (02): : 139 - 143
  • [50] System for Measuring Ionization Chamber Currents in Experiments with Synchrotron Radiation
    Dorokhov, D. V.
    Kuper, E. A.
    OPTOELECTRONICS INSTRUMENTATION AND DATA PROCESSING, 2015, 51 (01) : 76 - 80
12345