MEASUREMENTS OF PARAMETRIC X-RAYS FROM RELATIVISTIC ELECTRONS IN SILICON-CRYSTALS

被引:25
|
作者
ADISHCHEV, YN
DIDENKO, AN
MUN, VV
PLESHKOV, GA
POTYLITSIN, AP
TOMCHAKOV, VK
UGLOV, SR
VOROBIEV, SA
机构
关键词
D O I
10.1016/0168-583X(87)90138-8
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:49 / 55
页数:7
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