MEASUREMENTS OF PARAMETRIC X-RAYS FROM RELATIVISTIC ELECTRONS IN SILICON-CRYSTALS

被引：25
|
作者：
ADISHCHEV, YN
DIDENKO, AN
MUN, VV
PLESHKOV, GA
POTYLITSIN, AP
TOMCHAKOV, VK
UGLOV, SR
VOROBIEV, SA
机构：
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1987年 / 21卷 / 01期
关键词：
D O I：
10.1016/0168-583X(87)90138-8
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：49 / 55
页数：7
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