APPLICATION OF THIN-FILM DTA TO AMORPHOUS SELENIUM LAYERS

被引：5
|
作者：
PRZYLUSKI, J
PLOCHARSKI, J
BUJWAN, W
机构：
来源：
JOURNAL OF THERMAL ANALYSIS | 1981年 / 21卷 / 02期
关键词：
D O I：
10.1007/BF01914206
中图分类号：
O414.1 [热力学];
学科分类号：
摘要：
引用
收藏
页码：235 / 238
页数：4
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