DETERMINATION OF THE THICKNESS AND DISTRIBUTION OF A LANGMUIR-BLODGETT FILM USING SOFT-X-RAY REFLECTION

被引：20
|
作者：
MOMOSE, A
HIRAI, Y
WAKI, I
IMAZEKI, S
TOMIOKA, Y
HAYAKAWA, K
NAITO, M
机构：
来源：
THIN SOLID FILMS | 1989年 / 178卷
关键词：
D O I：
10.1016/0040-6090(89)90347-7
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：519 / 523
页数：5
相关论文
共 50 条
  • [31] X-ray diffraction study of gadolinium stearate Langmuir-Blodgett films
    Kov'ev, ÉK
    Polyakov, SN
    Tishin, AM
    Yurova, TV
    Khomutov, GB
    CRYSTALLOGRAPHY REPORTS, 2002, 47 (03) : 507 - 513
  • [32] X-ray diffraction study of gadolinium stearate Langmuir-Blodgett films
    Kov'ev, E.K.
    Polyakov, S.N.
    Tishin, A.M.
    Yurova, T.V.
    Khomutov, G.B.
    Kristallografiya, 2002, 47 (03): : 555 - 562
  • [33] In-situ X-ray diffraction study of Langmuir-Blodgett deposition
    Durbin, MK
    Malik, A
    Richter, AG
    Huang, KG
    Dutta, P
    LANGMUIR, 1997, 13 (24) : 6547 - 6549
  • [34] X-ray diffraction study of gadolinium stearate Langmuir-Blodgett films
    É. K. Kov'ev
    S. N. Polyakov
    A. M. Tishin
    T. V. Yurova
    G. B. Khomutov
    Crystallography Reports, 2002, 47 : 507 - 513
  • [35] Characterization of Langmuir-Blodgett Film Using Differential Charging in X-ray Photoelectron Spectroscopy (vol 112, pg 8528, 2008)
    Islam, A. K. M. Maidul
    Mukherjee, M.
    JOURNAL OF PHYSICAL CHEMISTRY B, 2010, 114 (08): : 3075 - 3075
  • [36] Infrared external reflection spectroscopic study on the structures of a conducting Langmuir-Blodgett film of a tetrathiafulvalene derivative
    Urai, Y
    Ohe, C
    Itoh, K
    LANGMUIR, 1998, 14 (17) : 4873 - 4879
  • [37] Structural characterization of sodium behenate Langmuir-Blodgett films using X-ray diffraction techniques
    Centro Nazionale per la Ricerca e, Sviluppo Materiali, Brindisi, Italy
    Thin Solid Films, 1-2 (291-294):
  • [38] Characterization of Langmuir-Blodgett organoclay films using X-ray reflectivity and atomic force microscopy
    Koo, Jaseung
    Park, Seongchan
    Satija, Sushil
    Tikhonov, Aleksey
    Sokolov, Jonathan C.
    Rafailovich, Miriam H.
    Koga, Tadanori
    JOURNAL OF COLLOID AND INTERFACE SCIENCE, 2008, 318 (01) : 103 - 109
  • [39] Structural characterisation of sodium behenate Langmuir-Blodgett films using X-ray diffraction techniques
    Milella, E
    Giannini, C
    Tapfer, L
    THIN SOLID FILMS, 1997, 293 (1-2) : 291 - 294
  • [40] SOFT-X-RAY PROJECTION IMAGING WITH MULTILAYER REFLECTION MASKS
    ITO, M
    OIZUMI, H
    SOGA, T
    YAMANASHI, H
    OGAWA, T
    KATAGIRI, S
    SEYA, E
    TAKEDA, E
    MICROELECTRONIC ENGINEERING, 1995, 27 (1-4) : 285 - 290
12345