LASER DIODE FEEDBACK INTERFEROMETER FOR STABILIZATION AND DISPLACEMENT MEASUREMENTS

被引：116
|
作者：
YOSHINO, T [1 ]
NARA, M [1 ]
MNATZAKANIAN, S [1 ]
LEE, BS [1 ]
STRAND, TC [1 ]
机构：
[1] IBM, ALMADEN RES CTR, SAN JOSE, CA 95120 USA
来源：
APPLIED OPTICS | 1987年 / 26卷 / 05期
关键词：
D O I：
10.1364/AO.26.000892
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
引用
收藏
页码：892 / 897
页数：6
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