ON THE X-RAY-ANALYSIS OF THIN SUBSURFACE LAYERS - BICRYSTAL DIFFRACTION ANALOGS

被引：15
|
作者：
AFANASEV, AM
FANCHENKO, SS
机构：
来源：
ACTA CRYSTALLOGRAPHICA SECTION A | 1988年 / 44卷
关键词：
D O I：
10.1107/S0108767387008158
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
引用
收藏
页码：25 / 33
页数：9
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