ERRORS IN MEASURING HIGH RESISTANCES ON DC BRIDGES

被引:0
|
作者
TEPLINSK.AM
机构
来源
关键词
D O I
暂无
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
引用
收藏
页码:638 / &
相关论文
共 50 条
  • [41] MEASUREMENT OF HIGH RESISTANCES
    VOLF, EM
    POLIKANOV, VS
    MEASUREMENT TECHNIQUES-USSR, 1972, 15 (04): : 617 - +
  • [42] Reducing fabrication errors in steel bridges
    Roddis, Kim
    Liu, Zhong
    Modern Steel Construction, 2000, 40 (04):
  • [43] ERRORS IN MEASURING PRECIPITATION
    KARBAUM, H
    ZEITSCHRIFT FUR METEOROLOGIE, 1979, 29 (03): : 191 - 194
  • [44] LINEARITY OF THERMISTOR MEASURING BRIDGES
    KRAUS, K
    INTERNATIONALE ELEKTRONISCHE RUNDSCHAU, 1970, 24 (10): : 271 - &
  • [45] COMPARATOR BRIDGE FOR TESTING HIGH-PRECISION RESISTANCE BOXES AND DC BRIDGES
    KALFKALI.SM
    MARTYNOV, AV
    MEASUREMENT TECHNIQUES-USSR, 1965, (11): : 997 - &
  • [46] INSTRUMENTATION FOR MEASURING DC CONDUCTIVITY OF VERY HIGH RESISTIVITY MATERIALS
    DORCAS, DS
    SCOTT, RN
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1964, 35 (09): : 1175 - &
  • [47] MEASURING DC AMPLIFIER FOR HIGH-PRECISION POTENTIOMETRIC ANALYZERS
    AVDEEV, VN
    MEASUREMENT TECHNIQUES, 1978, 21 (12) : 1713 - 1715
  • [48] Using a Natural Ratio to Compare DC and AC Resistances
    Yu, Kwang Min
    Jarrett, Dean G.
    Koffman, Andrew D.
    Rigosi, Albert F.
    Payagala, Shamith U.
    Ryu, Kwon Sang
    Kang, Jeon Hong
    Lee, Sang Hwa
    IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2020, 69 (08) : 5614 - 5619
  • [49] Comparison of DC and AC electro-analytical methods for measuring diode ideality factors and series resistances of silicon solar cells
    Crain, D. J.
    Rock, S. E.
    Garland, J. E.
    Roy, D.
    CURRENT APPLIED PHYSICS, 2013, 13 (09) : 2087 - 2097
  • [50] Measuring noise in dc/dc converters
    Cuff, Paul
    Electronic Products (Garden City, New York), 1996, 38 (10): : 27 - 29