DEPTH PROFILE DETERMINATION BY ION-INDUCED X-RAY SPECTROSCOPY

被引：33
|
作者：
PABST, W [1 ]
机构：
[1] TECH UNIV MUNICH,LEHRSTUHL INTEGRIERTE SCHALTUNGEN,MUNICH,WEST GERMANY
来源：
NUCLEAR INSTRUMENTS & METHODS | 1974年 / 120卷 / 03期
关键词：
D O I：
10.1016/0029-554X(74)90028-7
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：543 / 545
页数：3
相关论文
共 50 条
  • [41] Information depth and the mean escape depth in Auger electron spectroscopy and X-ray photoelectron spectroscopy
    Jablonski, A
    Powell, CJ
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 2003, 21 (01): : 274 - 283
  • [42] Depth profile of alloying extent and composition in bimetallic nanoparticles investigated by in situ x-ray absorption spectroscopy
    Hwang, B. J.
    Sarma, L. S.
    Chen, C. H.
    Tang, M. T.
    Liu, D. G.
    Lee, J. F.
    APPLIED PHYSICS LETTERS, 2007, 91 (02)
  • [43] Depth-Resolved X-ray Absorption Spectroscopy by Means of Grazing Emission X-ray Fluorescence
    Kayser, Yves
    Sa, Jacinto
    Szlachetko, Jakub
    ANALYTICAL CHEMISTRY, 2015, 87 (21) : 10815 - 10821
  • [44] Determination of Lithium-Ion Distributions in Nanostructured Block Polymer Electrolyte Thin Films by X-ray Photoelectron Spectroscopy Depth Profiling
    Gilbert, Jonathan B.
    Luo, Ming
    Shelton, Cameron K.
    Rubner, Michael F.
    Cohen, Robert E.
    Epps, Thomas H., III
    ACS NANO, 2015, 9 (01) : 512 - 520
  • [45] High resolution determination of the Ge depth profile in SiGe heterobipolar transistor structures by X-ray diffractometry
    Zaumseil, P
    PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1998, 165 (01): : 195 - 204
  • [46] Determination of the residual stress depth profile of uniaxial compacted ruthenium powder samples by X-ray diffraction
    Angerer, P.
    Neubauer, E.
    Yu, L. G.
    Khor, Khiam Aik
    INTERNATIONAL JOURNAL OF REFRACTORY METALS & HARD MATERIALS, 2009, 27 (06): : 1004 - 1008
  • [47] X-RAY SPECTROSCOPY - APPLICATION OF ION-BEAMS
    UDA, M
    DENKI KAGAKU, 1986, 54 (09): : 754 - 757
  • [48] X-ray spectroscopy on the active ion in laser crystals
    Miedema, P. S.
    Mitzner, R.
    Ganschow, S.
    Foehlisch, A.
    Beye, M.
    PHYSICAL CHEMISTRY CHEMICAL PHYSICS, 2017, 19 (32) : 21800 - 21806
  • [49] Wavelength determination of ion-induced ripples
    Etminan, Mahsa
    Aghamir, Farzin M.
    MATERIALS LETTERS, 2024, 358
  • [50] X-ray spectroscopy of ion-exchanged glasses
    Dubiel, M
    Brunsch, S
    BERICHTE DER BUNSEN-GESELLSCHAFT-PHYSICAL CHEMISTRY CHEMICAL PHYSICS, 1996, 100 (09): : 1578 - 1581
12345