SCANNING ELECTRON-MICROSCOPY - USE OF BACKSCATTERED ELECTRON IMAGE IN MATERIALS INVESTIGATIONS

被引：0
|
作者：
KISS, LT [1 ]
BRINKIES, HG [1 ]
机构：
[1] STATE ELECT COMMISS VICTORIA,HERMAN RES LAB,RICHMOND 3121,AUSTRALIA
来源：
JOURNAL OF THE AUSTRALASIAN INSTITUTE OF METALS | 1976年 / 21卷 / 04期
关键词：
D O I：
暂无
中图分类号：
TF [冶金工业];
学科分类号：
0806 ;
摘要：
引用
收藏
页码：178 / 182
页数：5
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