CHARACTERIZATION OF RU-DOPED INP SINGLE-CRYSTALS

被引:5
|
作者
COCKAYNE, B [1 ]
MACEWAN, WR [1 ]
HARRIS, IR [1 ]
SMITH, NA [1 ]
机构
[1] UNIV BIRMINGHAM,DEPT MET & MAT,BIRMINGHAM B15 2TT,W MIDLANDS,ENGLAND
关键词
D O I
10.1007/BF00726967
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:704 / 706
页数:3
相关论文
共 50 条
  • [31] DEVELOPMENT OF HIGH-QUALITY INP SINGLE-CRYSTALS
    MORIOKA, M
    TADA, K
    AKAI, S
    ANNUAL REVIEW OF MATERIALS SCIENCE, 1987, 17 : 75 - 100
  • [32] RECOMBINATION ENHANCED DISLOCATION GLIDE IN INP SINGLE-CRYSTALS
    MAEDA, K
    TAKEUCHI, S
    APPLIED PHYSICS LETTERS, 1983, 42 (08) : 664 - 666
  • [33] DEFECTS IN ZN-DIFFUSED INP SINGLE-CRYSTALS
    DIXON, RH
    JAGER, W
    RUCKI, A
    URBAN, K
    HETTWER, HG
    STOLWIJK, NA
    MEHRER, H
    MICROSCOPY OF SEMICONDUCTING MATERIALS 1993, 1993, (134): : 539 - 542
  • [34] ESR STUDIES OF IRRADIATED SINGLE-CRYSTALS OF KCL DOPED WITH [RU(CN)6]4-
    VISWANATH, AK
    ROGERS, MT
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1979, (APR): : 401 - 401
  • [35] Ru-doped phosphorene for electrochemical ammonia synthesis
    Jian-Dong Liu
    Zeng-Xi Wei
    Yu-Hai Dou
    Yue-Zhan Feng
    Jian-Min Ma
    RareMetals, 2020, 39 (08) : 874 - 880
  • [36] Ru-doped phosphorene for electrochemical ammonia synthesis
    Liu, Jian-Dong
    Wei, Zeng-Xi
    Dou, Yu-Hai
    Feng, Yue-Zhan
    Ma, Jian-Min
    RARE METALS, 2020, 39 (08) : 874 - 880
  • [37] GROWTH AND CHARACTERIZATION OF KDP-DOPED DENDRITIC SINGLE-CRYSTALS OF CADMIUM IODIDE
    KUMAR, B
    TRIGUNAYAT, GC
    PHASE TRANSITIONS, 1993, 43 (1-4) : 145 - 152
  • [38] PREPARATION AND CHARACTERIZATION OF IRON-DOPED RUS2 SINGLE-CRYSTALS
    TSAY, MY
    CHEN, SH
    CHEN, CS
    HUANG, YS
    JOURNAL OF CRYSTAL GROWTH, 1994, 144 (1-2) : 91 - 96
  • [39] GROWTH AND CHARACTERIZATION OF PURE AND CADMIUM DOPED STRONTIUM TARTRATE TETRAHYDRATE SINGLE-CRYSTALS
    RETHINAM, FJ
    ARIVUOLI, D
    RAMASAMY, S
    RAMASAMY, P
    MATERIALS RESEARCH BULLETIN, 1994, 29 (03) : 309 - 316
  • [40] CHARACTERIZATION OF THIN, DOPED SILICON SINGLE-CRYSTALS BY X-RAY-DIFFRACTION
    JOKSCH, S
    GRAEFF, W
    ZAUMSEIL, P
    WINTER, U
    CSEPREGI, L
    IBERL, F
    FREUND, AK
    JOURNAL OF APPLIED PHYSICS, 1992, 72 (01) : 54 - 60