FORENSIC APPLICATIONS OF SCANNING ELECTRON-MICROSCOPE

被引：0
|
作者：
JUDD, G
SABO, J
FERRISS, S
机构：
[1] RENSSELAER POLYTECH INST,TROY,NY 12181
[2] NEW YORK STATE POLICE SCI LAB,STATE CAMPUS,ALBANY,NY 12226
来源：
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY | 1974年
关键词：
D O I：
暂无
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
引用
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页码：12 / 12
页数：1
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