FORENSIC APPLICATIONS OF SCANNING ELECTRON-MICROSCOPE

被引：0

作者：

JUDD, G

SABO, J

FERRISS, S

机构：

[1] RENSSELAER POLYTECH INST,TROY,NY 12181

[2] NEW YORK STATE POLICE SCI LAB,STATE CAMPUS,ALBANY,NY 12226

来源：

关键词：

D O I：

暂无

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：12 / 12

页数：1

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