DETERMINATION OF THE ABSOLUTE STRUCTURE FACTOR FOR THE FORBIDDEN (222) REFLECTION IN SILICON USING 0.12-A GAMMA-RAYS

被引：44
作者：
ALKIRE, RW
YELON, WB
SCHNEIDER, JR
机构：
[1] HAHN MEITNER INST KERNFORSCH BERLIN GMBH,D-1000 BERLIN 39,FED REP GER
[2] UNIV MISSOURI,COLUMBIA,MO 65211
来源：
PHYSICAL REVIEW B | 1982年 / 26卷 / 06期
关键词：
D O I：
10.1103/PhysRevB.26.3097
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：3097 / 3104
页数：8
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