A COMPARISON BETWEEN PIXE AND RBS THIN-FILM THICKNESS MEASUREMENTS IN BINARY TARGETS

被引：13
|
作者：
OLIVER, A
MIRANDA, J
机构：
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1987年 / 29卷 / 03期
关键词：
D O I：
10.1016/0168-583X(87)90063-2
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：521 / 526
页数：6
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