SURFACE-ANALYSIS BY LASER IONIZATION APPLIED TO POLYMERIC MATERIAL

被引:0
|
作者
DAISER, SM [1 ]
MACKAY, SG [1 ]
机构
[1] PERKIN ELMER CORP, DIV PHYS ELECTR, EDEN PRAIRIE, MN 55344 USA
来源
关键词
D O I
暂无
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Single-photon ionization surface analysis by laser ionization (SPI-SALI) coupled with a static primary ion beam or a soft laser beam for desorption is a promising new method for the characterization of polymer surfaces. SPI-SALI combines nonresonant photoionization of desorbed or sputtered neutral atoms and molecules with analysis by time-of-flight mass spectrometry in ultrahigh vacuum. Stimulated desorption is accomplished by an ion source (Cs+, Ar+, or Ga+), electron gun, or laser-induced desorption (CO2 or Nd:YAG). Single-photon ionization using 118-nm light is useful for identifying polymer material, such as polyethylene glycol, polystyrene, polydimethyl siloxane, and many others, by the ease of the monomer identification.
引用
收藏
页码:727 / 743
页数:17
相关论文
共 50 条
  • [41] INSULATOR SURFACE-ANALYSIS
    LEGRESSUS, C
    BLAISE, G
    SURFACE AND INTERFACE ANALYSIS, 1994, 22 (1-12) : 254 - 257
  • [42] INSULATOR SURFACE-ANALYSIS
    LEGRESSUS, C
    BLAISE, G
    JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1992, 59 (01) : 73 - 96
  • [43] SURFACE-ANALYSIS OF SCREWPOSTS
    ARVIDSON, K
    WROBLEWSKI, R
    SCANDINAVIAN JOURNAL OF DENTAL RESEARCH, 1979, 87 (02): : 155 - 158
  • [44] SURFACE-ANALYSIS SYSTEMS
    DUMITRESCU, P
    REVISTA DE CHIMIE, 1984, 35 (02): : 158 - 166
  • [45] MORE ON SURFACE-ANALYSIS
    BURROWS, VA
    RESEARCH & DEVELOPMENT, 1987, 29 (05): : 162 - 163
  • [46] SURFACE-ANALYSIS IN MICROELECTRONICS
    PIGNATARO, S
    FRESENIUS JOURNAL OF ANALYTICAL CHEMISTRY, 1995, 353 (3-4): : 227 - 233
  • [47] SURFACE-ANALYSIS FOR OPTIMIZATION OF INDUSTRIAL-PROCESSES AND NEW MATERIAL DEVELOPMENT
    WECHSUNG, R
    TECHNISCHES MESSEN, 1987, 54 (09): : 319 - 319
  • [48] QUANTIFICATION IN SURFACE-ANALYSIS
    ROTUNNO, T
    MALITESTA, C
    SABBATINI, L
    MICROCHEMICAL JOURNAL, 1992, 46 (03) : 340 - 345
  • [49] SOFTWARE FOR SURFACE-ANALYSIS
    WATSON, DG
    DOERN, FE
    APPLIED SURFACE SCIENCE, 1985, 21 (1-4) : 304 - 313
  • [50] SURFACE-ANALYSIS IN THE TEM
    RAJAN, K
    SEWELL, P
    JOURNAL OF METALS, 1986, 38 (10): : 34 - 35