TRANSIENT ANALYSIS OF A MULTIPLE-UNIT REDUNDANT SYSTEM

被引：1
|
作者：
GOEL, LR [1 ]
SHRIVASTAVA, P [1 ]
机构：
[1] MM COLL,DEPT STAT,MODINAGAR 201204,INDIA
来源：
MICROELECTRONICS AND RELIABILITY | 1992年 / 32卷 / 10期
关键词：
D O I：
10.1016/0026-2714(92)90003-4
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The transient behaviour of an n-unit cold standby stystem with a single repair facility is investigated. The Chapman-Kolmogorov equations for the said system are developed and solved using the matrix approach. Expressions for system availability, reliability, MTSF and the probability of the system being under repair have been obtained. A particular case has been illustrated using graphs.
引用
收藏
页码：1361 / 1365
页数：5
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