USE OF KINEMATICAL DIFFRACTION IN X-RAY TOPOGRAPHY

被引：4

|

作者：

ALEXANDROPOULOS, NG

KOTSIS, KT

机构：

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1985年 / 18卷 / DEC期

关键词：

D O I：

10.1107/S0021889885010792

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

收藏

页码：509 / 512

页数：4

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