Reconstruction of the dielectric contrast profile from near-field data

被引：16
|
作者：
Carminati, R
Greffet, JJ
机构：
[1] Laboratoire d'Energétique Macroscopique et Moléculaire, Combustion, Ecole Centrale Paris, F-92295 Châtenay-Malabry Cedex, Grande Voie des Vignes
来源：
ULTRAMICROSCOPY | 1995年 / 61卷 / 1-4期
关键词：
D O I：
10.1016/0304-3991(95)00138-7
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
A perturbative model describing the influence of topography and dielectric contrast on the near field scattered by an inhomogeneous surface is derived. It is shown that the near-field intensity is sensitive to the integral of the dielectric contrast in the vertical direction across the sample. A solution to the inverse problem from a measurement of the near-field intensity along a line at a constant height above the surface is reported.
引用
收藏
页码：11 / 16
页数：6
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