ELECTRICAL SURFACE-PROPERTIES OF TIO2 IN SOLUTIONS OF DIFFERENT ELECTROLYTES

被引：0
|
作者：
TASEV, DK
KOLMAKOVA, GA
SIDOROVA, MP
FRIDRIKHSBERG, DD
机构：
来源：
COLLOID JOURNAL OF THE USSR | 1982年 / 44卷 / 02期
关键词：
D O I：
暂无
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
引用
收藏
页码：341 / 344
页数：4
相关论文
共 50 条
  • [31] Structure, Surface Properties and Photocatalytic Activity of TiO2 and TiO2/SiO2 Catalysts Prepared at Different pH Values
    Qiu Wei
    Ren Cheng-Jun
    Gong Mao-Chu
    Hou Yun-Ze
    Chen Yao-Qiang
    ACTA PHYSICO-CHIMICA SINICA, 2011, 27 (06) : 1487 - 1492
  • [32] SURFACE-PROPERTIES OF TERNARY SOLUTIONS OF NORMAL ALKANES
    PUGACHEVICH, PP
    CHERKASSKAYA, AI
    ZHURNAL FIZICHESKOI KHIMII, 1980, 54 (09): : 2335 - 2338
  • [33] TiO2 nano-particles in polymer electrolytes:: surface interactions
    Johansson, P
    Jacobsson, P
    SOLID STATE IONICS, 2004, 170 (1-2) : 73 - 78
  • [34] Electrical properties of polycrystalline TiO2: Equilibration kinetics
    J. Nowotny
    T. Bak
    T. Burg
    Ionics, 2007, 13 : 71 - 78
  • [35] ELECTRICAL PROPERTIES OF RUTILE (TIO2) THIN FILM
    KATSUTA, Y
    AKAHANE, R
    YAHAGI, K
    JAPANESE JOURNAL OF APPLIED PHYSICS, 1971, 10 (08) : 976 - &
  • [36] Electrical properties of polycrystalline TiO2· Thermoelectric power
    J. Nowotny
    T. Bak
    T. Burg
    Ionics, 2007, 13 : 155 - 162
  • [37] Electrical properties of polycrystalline TiO2:: Equilibration kinetics
    Nowotny, J.
    Bak, T.
    Burg, T.
    IONICS, 2007, 13 (02) : 71 - 78
  • [38] ELECTRICAL-PROPERTIES OF NANOSTRUCTURED TIO2 PHOTOANODES
    FEI, C
    SEARSON, PC
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1994, 208 : 272 - PHYS
  • [39] Electrical properties and defect chemistry of anatase (TiO2)
    Weibel, A
    Bouchet, R
    Knauth, P
    SOLID STATE IONICS, 2006, 177 (3-4) : 229 - 236
  • [40] Effect of microstructural features on the electrical properties of TiO2
    Song, SH
    Wang, X
    Xiao, P
    MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 2002, 94 (01): : 40 - 47
12345