ANGULAR-DEPENDENCE OF MAGNETORESISTIVITY OF BISMUTH

被引:6
|
作者
SUMENGEN, Z
TURETKEN, N
SAUNDERS, GA
机构
[1] MIDDLE E TECH UNIV,DEPT PHYS,ANGORA,TURKEY
[2] UNIV DURHAM,DEPT APPL PHYS & ELECTR,DURHAM,ENGLAND
来源
关键词
D O I
10.1088/0022-3719/7/12/013
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
引用
收藏
页码:2204 / 2210
页数:7
相关论文
共 50 条
  • [11] ANGULAR-DEPENDENCE OF THE GIANT MAGNETORESISTANCE EFFECT
    STEREN, LB
    BARTHELEMY, A
    DUVAIL, JL
    FERT, A
    MOREL, R
    PETROFF, F
    HOLODY, P
    LOLOEE, R
    SCHROEDER, PA
    PHYSICAL REVIEW B, 1995, 51 (01): : 292 - 296
  • [12] ANGULAR-DEPENDENCE OF MAGNETIZATION IN RECORDING MEDIA
    TEMPLETON, TL
    ARROTT, AS
    YOSHIDA, Y
    IEEE TRANSACTIONS ON MAGNETICS, 1994, 30 (06) : 4263 - 4265
  • [13] ANGULAR-DEPENDENCE AND COMPETITION OF COERCIVITY MECHANISMS
    ELK, K
    JAHN, L
    JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 1991, 102 (1-2) : 159 - 165
  • [14] ANGULAR-DEPENDENCE OF COERCIVITY IN SINTERED MAGNETS
    GIVORD, D
    TENAUD, P
    VIADIEU, T
    JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 1988, 72 (03) : 247 - 252
  • [15] ANGULAR-DEPENDENCE OF THE DETECTION LIMIT OF PIXE
    CHU, TC
    ISHII, K
    YAMADERA, A
    SEBATA, M
    MORITA, S
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1981, 190 (02): : 395 - 399
  • [16] ANGULAR-DEPENDENCE OF SPIN POLARIZATION OF PHOTOELECTRONS
    HUANG, KN
    PHYSICS LETTERS A, 1980, 77 (2-3) : 133 - 136
  • [17] ANGULAR-DEPENDENCE OF SUPERCONDUCTING CRITICAL FIELDS
    TAKANAKA, K
    JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1989, 58 (02) : 668 - 672
  • [18] ANGULAR-DEPENDENCE OF STICKING COEFFICIENTS ON TUNGSTEN
    STEINBRUCHEL, C
    SCHMIDT, LD
    PHYSICAL REVIEW LETTERS, 1974, 32 (11) : 594 - 596
  • [19] ANGULAR-DEPENDENCE OF COHERENT BACKWARD SCATTERING
    KUZMIN, VL
    ROMANOV, VP
    KUZMIN, LV
    OPTIKA I SPEKTROSKOPIYA, 1992, 73 (02): : 376 - 387
  • [20] HIGHER-ORDER ANGULAR-DEPENDENCE OF THE POSITIVE-MUON KNIGHT-SHIFT IN BISMUTH
    GYGAX, FN
    SCHENCK, A
    VANDERWAL, AJ
    BARTH, S
    PHYSICAL REVIEW LETTERS, 1986, 56 (26) : 2842 - 2845