INTERFACE ROUGHENING DUE TO RANDOM IMPURITIES AT LOW-TEMPERATURES

被引：30

|

作者：

NATTERMANN, T

RENZ, W

机构：

来源：

PHYSICAL REVIEW B | 1988年 / 38卷 / 07期

关键词：

D O I：

10.1103/PhysRevB.38.5184

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

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页码：5184 / 5187

页数：4

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