METHODS OF DETERMINING OPTICAL-CONSTANTS OF THIN SEMICONDUCTOR-FILMS USING NORMAL INCIDENCE REFLECTANCE AND TRANSMITTANCE DATA

被引：0

作者：

MCKENZIE, DR

MCPHEDRAN, RC

SAVVIDES, N

BOTTEN, LC

MARTIN, PJ

NETTERFIELD, RP

机构：

[1] NEW S WALES INST TECHNOL,SCH MATH SCI,BROADWAY,NSW 2000,AUSTRALIA

[2] CSIRO,NATL MEASUREMENT LAB,DIV APPL PHYS,LINDFIELD,NSW 2070,AUSTRALIA

[3] UNIV SYDNEY,SCH PHYS,SYDNEY,NSW 2006,AUSTRALIA

来源：

PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS | 1983年 / 369卷

关键词：

D O I：

暂无

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：110 / 117

页数：8

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