ANALOG CIRCUITS FAULT DICTIONARY - NEW APPROACHES AND IMPLEMENTATION

被引：68
|
作者：
LIN, PM
ELCHERIF, YS
机构：
来源：
INTERNATIONAL JOURNAL OF CIRCUIT THEORY AND APPLICATIONS | 1985年 / 13卷 / 02期
关键词：
D O I：
10.1002/cta.4490130205
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：149 / 172
页数：24
相关论文
共 50 条
  • [21] Fault diagnosis for linear analog circuits
    Lin, JW
    Lee, CL
    Su, CC
    Chen, JE
    PROCEEDINGS OF THE NINTH ASIAN TEST SYMPOSIUM (ATS 2000), 2000, : 25 - 30
  • [22] FAULT PREDICTION FOR ANALOG CIRCUITS - COMMENT
    PRASAD, VC
    PINJALA, SNR
    CIRCUITS SYSTEMS AND SIGNAL PROCESSING, 1990, 9 (04) : 505 - 505
  • [23] FAULT PREDICTION FOR ANALOG CIRCUITS - REPLY
    JIANG, BL
    WEY, CL
    FAN, LJ
    CIRCUITS SYSTEMS AND SIGNAL PROCESSING, 1990, 9 (04) : 503 - 503
  • [24] Functional fault models for analog circuits
    Malyshenko, YV
    IEEE DESIGN & TEST OF COMPUTERS, 1998, 15 (02): : 80 - 85
  • [25] FAULT-DIAGNOSIS OF ANALOG CIRCUITS
    BANDLER, JW
    SALAMA, AE
    PROCEEDINGS OF THE IEEE, 1985, 73 (08) : 1279 - 1325
  • [26] Extending a fault dictionary towards a case based reasoning system for linear electronic analog circuits diagnosis
    Pous, C
    Colomer, J
    Melendez, J
    ADVANCES IN CASE-BASED REASONING, PROCEEDINGS, 2004, 3155 : 748 - 762
  • [27] DC APPROACH FOR ANALOG FAULT DICTIONARY DETERMINATION
    HOCHWALD, W
    BASTIAN, JD
    IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS, 1979, 26 (07): : 523 - 529
  • [28] Multistable circuits for analog memories implementation
    Biagetti, G
    Conti, M
    Orcioni, S
    ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING, 2004, 39 (01) : 109 - 122
  • [29] Multistable Circuits for Analog Memories Implementation
    Giorgio Biagetti
    Massimo Conti
    Simone Orcioni
    Analog Integrated Circuits and Signal Processing, 2004, 39 : 109 - 122
  • [30] Fault-trajectory approach for fault diagnosis on analog circuits
    Savioli, CE
    Czendrodi, CC
    Calvano, JV
    de Mesquita, AC
    DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION, VOLS 1 AND 2, PROCEEDINGS, 2005, : 174 - 175
12345