BOUNDARY SCAN AND ITS APPLICATION TO ANALOG-DIGITAL ASIC TESTING IN A BOARD SYSTEM ENVIRONMENT

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作者：
FASANG, PP
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来源：
PROCEEDINGS OF THE IEEE 1989 CUSTOM INTEGRATED CIRCUITS CONFERENCE | 1989年
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TM [电工技术]; TN [电子技术、通信技术];
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0808 ; 0809 ;
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页码：663 / 666
页数：4
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