BOUNDARY SCAN AND ITS APPLICATION TO ANALOG-DIGITAL ASIC TESTING IN A BOARD SYSTEM ENVIRONMENT

被引：0

作者：

FASANG, PP

机构：

来源：

PROCEEDINGS OF THE IEEE 1989 CUSTOM INTEGRATED CIRCUITS CONFERENCE | 1989年

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中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：663 / 666

页数：4

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