THERMAL-WAVE IMAGING IN A SCANNING ELECTRON-MICROSCOPE

被引：0

作者：

ROSENCWAIG, A ^{[1
]}

机构：

[1] THERMA INC, FREMONT, CA 94539 USA

来源：

SCANNING ELECTRON MICROSCOPY | 1984年

关键词：

D O I：

暂无

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：1611 / 1628

页数：18

共 50 条

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