ACCURACY OF THICK-TARGET MICRO-PIXE ANALYSIS

被引：9
|
作者：
CAMPBELL, JL
TEESDALE, WJ
WANG, JX
机构：
[1] Guelph-Waterloo Program for Graduate Work in Physics, University of Guelph, Guelph
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1990年 / 50卷 / 1-4期
基金：
加拿大自然科学与工程研究理事会;
关键词：
D O I：
10.1016/0168-583X(90)90354-W
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
The accuracy attainable in micro-PIXE analysis is assessed in terms of the X-ray production model and its assumptions, physical realities of the specimen, the necessary data base, and techniques of standardization. NTIS reference materials are analyzed to provide the experimental tests of accuracy. © 1990.
引用
收藏
页码：189 / 196
页数：8
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