SQUARE-WAVE VOLTAMMETRY OF AN ADSORBED REACTANT

被引：259
|
作者：
LOVRIC, M [1 ]
KOMORSKYLOVRIC, S [1 ]
机构：
[1] FORSCHUNGSZENTRUM JULICH, NUCL RES CTR, INST APPL PHYS CHEM, D-5170 JULICH 1, FED REP GER
来源：
JOURNAL OF ELECTROANALYTICAL CHEMISTRY | 1988年 / 248卷 / 02期
关键词：
D O I：
10.1016/0022-0728(88)85089-7
中图分类号：
O65 [分析化学];
学科分类号：
070302 ; 081704 ;
摘要：
引用
收藏
页码：239 / 253
页数：15
相关论文
共 50 条
  • [1] SQUARE-WAVE VOLTAMMETRY IN STUDIES OF REACTANT ADSORPTION AND MICELLAR ELECTROCATALYSIS
    RUSLING, JF
    OWLIA, A
    SHI, CN
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1987, 193 : 95 - ANYL
  • [2] Measurement of the kinetics of adsorbed cinnoline by square-wave voltammetry
    Š Komorsky-Lovrić
    Analytical and Bioanalytical Chemistry, 2002, 373 : 777 - 780
  • [3] Measurement of the kinetics of adsorbed cinnoline by square-wave voltammetry
    Komorsky-Lovric, S
    ANALYTICAL AND BIOANALYTICAL CHEMISTRY, 2002, 373 (08) : 777 - 780
  • [4] SQUARE-WAVE VOLTAMMETRY
    OSTERYOUNG, J
    ODEA, JJ
    ELECTROANALYTICAL CHEMISTRY, 1986, 14 : 209 - 308
  • [5] SQUARE-WAVE VOLTAMMETRY
    OSTERYOUNG, JG
    OSTERYOUNG, RA
    ANALYTICAL CHEMISTRY, 1985, 57 (01) : A101 - &
  • [6] Square-wave voltammetry
    Mirceski, Valentin
    Skrzypek, Slawomira
    Stojanov, Leon
    CHEMTEXTS, 2018, 4 (04):
  • [7] THIN-LAYER SQUARE-WAVE VOLTAMMETRY AND SQUARE-WAVE STRIPPING VOLTAMMETRY
    KUMAR, V
    HEINEMAN, WR
    ANALYTICAL CHEMISTRY, 1987, 59 (06) : 842 - 846
  • [8] Theory of square-wave voltammetry of a reversible redox reaction complicated by the reactant adsorption
    Lovric, M
    ELECTROANALYSIS, 2002, 14 (06) : 405 - 414
  • [9] THIN-LAYER OSTERYOUNG SQUARE-WAVE VOLTAMMETRY AND SQUARE-WAVE STRIPPING VOLTAMMETRY
    KUMAR, V
    HEINEMAN, WR
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1986, 192 : 114 - ANYL
  • [10] Theory of reverse scan square-wave voltammetry influenced by the kinetics of reactant adsorption
    Lovric, Milivoj
    Komorsky-Lovric, Sebojka
    CENTRAL EUROPEAN JOURNAL OF CHEMISTRY, 2010, 8 (03): : 513 - 518
12345