CODING OF SPATIAL AND CHROMATIC INFORMATION BY MEANS OF FOURIER HOLOGRAPHY IN WHITE-LIGHT

被引：4
|
作者：
CALATRONI, J [1 ]
机构：
[1] UNIV FRANCHE COMTE,CNRS,PHYS GEN & OPTIQUE LAB 214,F-25030 BESANCON,FRANCE
来源：
OPTICS COMMUNICATIONS | 1976年 / 19卷 / 01期
关键词：
D O I：
10.1016/0030-4018(76)90382-5
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
引用
收藏
页码：49 / 53
页数：5
相关论文
共 50 条
  • [21] Surface-Plasmon Holography with White-Light Illumination
    Ozaki, Miyu
    Kato, Jun-ichi
    Kawata, Satoshi
    SCIENCE, 2011, 332 (6026) : 218 - 220
  • [22] WHITE-LIGHT TRANSMISSION COLOR-HOLOGRAPHY - A REVIEW
    YU, FTS
    GERHART, G
    OPTICAL ENGINEERING, 1985, 24 (05) : 812 - 819
  • [23] SIGNAL-TO-NOISE LIMITATIONS IN WHITE-LIGHT HOLOGRAPHY
    RIBAK, E
    RODDIER, C
    RODDIER, F
    BRECKINRIDGE, JB
    APPLIED OPTICS, 1988, 27 (06): : 1183 - 1186
  • [24] Reference Wave Adaptation in Digital Lensless Fourier Holography by means of a Spatial Light Modulator
    Meeser, Thomas
    Falldorf, Claas
    von Kopylow, Christoph
    Bergmann, Ralf B.
    OPTICAL MEASUREMENT SYSTEMS FOR INDUSTRIAL INSPECTION VII, 2011, 8082
  • [25] WHITE-LIGHT INFORMATION-PROCESSING
    LEITH, E
    ROTH, J
    JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1977, 67 (10) : 1423 - 1423
  • [26] CALCULATION OF WHITE-LIGHT MTF IN THE EXISTENCE OF LATERAL CHROMATIC ABERRATION
    OGAWA, R
    TACHIHARA, S
    JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1980, 70 (08) : 1037 - 1037
  • [27] Nanorelief Measurements Errors for a White-Light Interferometer with Chromatic Aberrations
    Sysoev, Evgeny V.
    MEASUREMENT TECHNOLOGY AND INTELLIGENT INSTRUMENTS IX, 2010, 437 : 51 - 55
  • [28] WHITE-LIGHT 3-D IMAGE PLANE HOLOGRAPHY
    GERHART, GR
    JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 1986, 3 (13): : P113 - P113
  • [29] ACHROMATIC INTERFEROMETERS FOR WHITE-LIGHT OPTICAL-PROCESSING AND HOLOGRAPHY
    LEITH, EN
    SWANSON, GJ
    APPLIED OPTICS, 1980, 19 (04): : 638 - 644
  • [30] Fiber Optic Fourier Transform White-Light Interferometry
    Y. Jiang and C.-J. Tang are with School of Information Science and Technology
    Journal of Electronic Science and Technology, 2008, 6 (04) : 489 - 491
12345