首页
学术期刊
论文检测
AIGC检测
热点
更多
数据
SILICON LAYERS GROWN BY DIFFERENTIAL MOLECULAR-BEAM EPITAXY
被引:19
|
作者
:
HERZOG, HJ
论文数:
0
引用数:
0
h-index:
0
机构:
AEG-Telefunken Forschungsinstitut, Ulm, West Ger, AEG-Telefunken Forschungsinstitut, Ulm, West Ger
HERZOG, HJ
KASPER, E
论文数:
0
引用数:
0
h-index:
0
机构:
AEG-Telefunken Forschungsinstitut, Ulm, West Ger, AEG-Telefunken Forschungsinstitut, Ulm, West Ger
KASPER, E
机构
:
[1]
AEG-Telefunken Forschungsinstitut, Ulm, West Ger, AEG-Telefunken Forschungsinstitut, Ulm, West Ger
来源
:
JOURNAL OF THE ELECTROCHEMICAL SOCIETY
|
1985年
/ 132卷
/ 09期
关键词
:
D O I
:
10.1149/1.2114325
中图分类号
:
O646 [电化学、电解、磁化学];
学科分类号
:
081704 ;
摘要
:
SEMICONDUCTING SILICON
引用
收藏
页码:2227 / 2231
页数:5
相关论文
共 50 条
[21]
DOPANT INCORPORATION PROCESSES IN SILICON GROWN BY MOLECULAR-BEAM EPITAXY
IYER, SS
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IYER, SS
METZGER, RA
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
METZGER, RA
ALLEN, FG
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
ALLEN, FG
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1984,
131
(03)
: C84
-
C84
[22]
ELIMINATION OF MICROTWINS IN SILICON GROWN ON SAPPHIRE BY MOLECULAR-BEAM EPITAXY
TWIGG, ME
论文数:
0
引用数:
0
h-index:
0
机构:
USN,RES LAB,CODE 6816,WASHINGTON,DC 20375
USN,RES LAB,CODE 6816,WASHINGTON,DC 20375
TWIGG, ME
RICHMOND, ED
论文数:
0
引用数:
0
h-index:
0
机构:
USN,RES LAB,CODE 6816,WASHINGTON,DC 20375
USN,RES LAB,CODE 6816,WASHINGTON,DC 20375
RICHMOND, ED
PELLEGRINO, JG
论文数:
0
引用数:
0
h-index:
0
机构:
USN,RES LAB,CODE 6816,WASHINGTON,DC 20375
USN,RES LAB,CODE 6816,WASHINGTON,DC 20375
PELLEGRINO, JG
APPLIED PHYSICS LETTERS,
1989,
54
(18)
: 1766
-
1768
[23]
SILICON METAL SILICIDE HETEROSTRUCTURES GROWN BY MOLECULAR-BEAM EPITAXY
BEAN, JC
论文数:
0
引用数:
0
h-index:
0
BEAN, JC
POATE, JM
论文数:
0
引用数:
0
h-index:
0
POATE, JM
APPLIED PHYSICS LETTERS,
1980,
37
(07)
: 643
-
646
[24]
SILICON MOLECULAR-BEAM EPITAXY
KUBIAK, R
论文数:
0
引用数:
0
h-index:
0
KUBIAK, R
PARKER, E
论文数:
0
引用数:
0
h-index:
0
PARKER, E
ELECTRONICS AND POWER,
1984,
30
(11-1):
: 853
-
856
[25]
SILICON MOLECULAR-BEAM EPITAXY
BEAN, JC
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC, MURRAY HILL, NJ 07974 USA
BELL TEL LABS INC, MURRAY HILL, NJ 07974 USA
BEAN, JC
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1979,
126
(03)
: C121
-
C121
[26]
SILICON MOLECULAR-BEAM EPITAXY
OTA, Y
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC, READING, PA 19604 USA
BELL TEL LABS INC, READING, PA 19604 USA
OTA, Y
THIN SOLID FILMS,
1983,
106
(1-2)
: 3
-
136
[27]
SILICON MOLECULAR-BEAM EPITAXY
SHIRAKI, Y
论文数:
0
引用数:
0
h-index:
0
SHIRAKI, Y
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B,
1985,
3
(02):
: 725
-
729
[28]
MOLECULAR-BEAM EPITAXY OF SILICON
KASPER, E
论文数:
0
引用数:
0
h-index:
0
KASPER, E
1979,
52
(1-2):
: 147
-
155
[29]
SILICON MOLECULAR-BEAM EPITAXY
SHIRAKI, Y
论文数:
0
引用数:
0
h-index:
0
机构:
HITACHI LTD, CENT RES LAB, KOKUBUNJI, TOKYO 185, JAPAN
HITACHI LTD, CENT RES LAB, KOKUBUNJI, TOKYO 185, JAPAN
SHIRAKI, Y
PROGRESS IN CRYSTAL GROWTH AND CHARACTERIZATION OF MATERIALS,
1986,
12
(1-4)
: 45
-
66
[30]
SILICON MOLECULAR-BEAM EPITAXY
GRAVESTEIJN, DJ
论文数:
0
引用数:
0
h-index:
0
机构:
Philips Research Laboratories, Eindhoven, NL-5600 JA
GRAVESTEIJN, DJ
VANDEWALLE, GFA
论文数:
0
引用数:
0
h-index:
0
机构:
Philips Research Laboratories, Eindhoven, NL-5600 JA
VANDEWALLE, GFA
VANGORKUM, AA
论文数:
0
引用数:
0
h-index:
0
机构:
Philips Research Laboratories, Eindhoven, NL-5600 JA
VANGORKUM, AA
ADVANCED MATERIALS,
1991,
3
(7-8)
: 351
-
355
←
1
2
3
4
5
→